BibSLEIGH — Li-C

Travelled to:

11 × USA
2 × Germany
4 × France

Collaborated with:

M.S.Abadir K.Cheng P.Bastani N.Callegari J.Liou D.G.Drmanac A.Krstic F.Lu ∅ T.M.Mak M.K.Iyer G.Parthasarathy F.Liu B.N.Lee M.C.Chao N.Krishnamurthy J.Zeng W.Chen J.Bhadra K.Killpack E.Chiprout O.Guzey J.R.Levitt H.Foster T.Feng C.Lin C.Ong D.Hong R.C.Huang N.Sumikawa L.Winemberg J.Moondanos Z.Hanna K.Chen J.Dworak M.R.Mercer R.Kapur T.W.Williams

Talks about:

test (9) time (8) base (7) statist (6) delay (6) learn (5) diagnosi (4) analysi (4) solver (4) effici (4)

Person: Li-C. Wang

DBLP: Wang:Li=C=

Contributed to:

2014

2013

2011

2010

2009

2008

2007

2006

2005

2004

2003

2002

1998

Wrote 26 papers:

DAC-2014-WangA #constraints #data mining #mining: Data Mining In EDA — Basic Principles, Promises, and Constraints (LCW, MSA), p. 6.
DAC-2013-ChenWBA #random #reuse #simulation #verification: Simulation knowledge extraction and reuse in constrained random processor verification (WC, LCW, JB, MSA), p. 6.
DATE-2011-DrmanacSWWA #multi #optimisation #parametricity #predict #testing: Multidimensional parametric test set optimization of wafer probe data for predicting in field failures and setting tighter test limits (DGD, NS, LW, LCW, MSA), pp. 794–799.
DAC-2010-CallegariDWA #classification #learning #using: Classification rule learning using subgroup discovery of cross-domain attributes responsible for design-silicon mismatch (NC, DGD, LCW, MSA), pp. 374–379.
DAC-2009-CallegariWB #analysis #ranking: Speedpath analysis based on hypothesis pruning and ranking (NC, LCW, PB), pp. 346–351.
DAC-2009-DrmanacLW #predict #process #variability: Predicting variability in nanoscale lithography processes (DGD, FL, LCW), pp. 545–550.
DAC-2008-BastaniCWA #statistics: Statistical diagnosis of unmodeled systematic timing effects (PB, NC, LCW, MSA), pp. 355–360.
DAC-2008-BastaniKWC #learning #predict #set: Speedpath prediction based on learning from a small set of examples (PB, KK, LCW, EC), pp. 217–222.
DAC-2008-GuzeyWLF #analysis #functional #testing: Functional test selection based on unsupervised support vector analysis (OG, LCW, JRL, HF), pp. 262–267.
DAC-2007-WangBA #correlation #data mining #mining #perspective: Design-Silicon Timing Correlation A Data Mining Perspective (LCW, PB, MSA), pp. 384–389.
DAC-2006-LeeWA #analysis #statistics: Refined statistical static timing analysis through (BNL, LCW, MSA), pp. 149–154.
DATE-2005-LuIPWCC #performance #satisfiability: An Efficient Sequential SAT Solver With Improved Search Strategies (FL, MKI, GP, LCW, KTC, KCC), pp. 1102–1107.
DAC-2004-ParthasarathyICW #constraints #performance #theorem proving: An efficient finite-domain constraint solver for circuits (GP, MKI, KTC, LCW), pp. 212–217.
DAC-2004-WangMCA #learning #on the: On path-based learning and its applications in delay test and diagnosis (LCW, TMM, KTC, MSA), pp. 492–497.
DATE-v1-2004-FengWCL #clustering #simulation: Improved Symoblic Simulation by Dynamic Funtional Space Partitioning (TF, LCW, KTC, CCL), pp. 42–49.
DATE-v1-2004-OngHCW #multi #random: Random Jitter Extraction Technique in a Multi-Gigahertz Signal (CKO, DH, KTC, LCW), pp. 286–291.
DATE-v1-2004-Wang #learning #simulation #validation: Regression Simulation: Applying Path-Based Learning In Delay Test and Post-Silicon Validation (LCW), pp. 692–695.
DATE-v2-2004-MangoCWC #fault #testing: Pattern Selection for Testing of Deep Sub-Micron Timing Defects (MCTC, LCW, KTC), p. 160.
DAC-2003-KrsticWCLM #fault #modelling #statistics: Enhancing diagnosis resolution for delay defects based upon statistical timing and statistical fault models (AK, LCW, KTC, JJL, TMM), pp. 668–673.
DAC-2003-LuWCMH #case study #correlation #industrial: A signal correlation guided ATPG solver and its applications for solving difficult industrial cases (FL, LCW, KTC, JM, ZH), pp. 436–441.
DATE-2003-KrsticWCLA #fault #modelling #statistics: Delay Defect Diagnosis Based Upon Statistical Timing Models — The First Step (AK, LCW, KTC, JJL, MSA), pp. 10328–10335.
DATE-2003-LuWCH #correlation #learning #satisfiability: A Circuit SAT Solver With Signal Correlation Guided Learning (FL, LCW, KTC, RCYH), pp. 10892–10897.
DAC-2002-LiouKWC #analysis #performance #statistics #testing #validation: False-path-aware statistical timing analysis and efficient path selection for delay testing and timing validation (JJL, AK, LCW, KTC), pp. 566–569.
DAC-2002-LiouWCDMKW #fault #multi #performance #testing #using: Enhancing test efficiency for delay fault testing using multiple-clocked schemes (JJL, LCW, KTC, JD, MRM, RK, TWW), pp. 371–374.
DAC-1998-WangAK #array #automation #evaluation #generative #using #verification: Automatic Generation of Assertions for Formal Verification of PowerPC Microprocessor Arrays Using Symbolic Trajectory Evaluation (LCW, MSA, NK), pp. 534–537.
DATE-1998-WangAZ #array #design #effectiveness #validation: Measuring the Effectiveness of Various Design Validation Approaches For PowerPC(TM) Microprocessor Arrays (LCW, MSA, JZ), pp. 273–277.