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Travelled to:
11 × USA
2 × Germany
4 × France
Collaborated with:
M.S.Abadir K.Cheng P.Bastani N.Callegari J.Liou D.G.Drmanac A.Krstic F.Lu T.M.Mak M.K.Iyer G.Parthasarathy F.Liu B.N.Lee M.C.Chao N.Krishnamurthy J.Zeng W.Chen J.Bhadra K.Killpack E.Chiprout O.Guzey J.R.Levitt H.Foster T.Feng C.Lin C.Ong D.Hong R.C.Huang N.Sumikawa L.Winemberg J.Moondanos Z.Hanna K.Chen J.Dworak M.R.Mercer R.Kapur T.W.Williams
Talks about:
test (9) time (8) base (7) statist (6) delay (6) learn (5) diagnosi (4) analysi (4) solver (4) effici (4)

Person: Li-C. Wang

DBLP DBLP: Wang:Li=C=

Contributed to:

DAC 20142014
DAC 20132013
DATE 20112011
DAC 20102010
DAC 20092009
DAC 20082008
DAC 20072007
DAC 20062006
DATE 20052005
DAC 20042004
DATE v1 20042004
DATE v2 20042004
DAC 20032003
DATE 20032003
DAC 20022002
DAC 19981998
DATE 19981998

Wrote 26 papers:

DAC-2014-WangA #constraints #data mining #mining
Data Mining In EDA — Basic Principles, Promises, and Constraints (LCW, MSA), p. 6.
DAC-2013-ChenWBA #random #reuse #simulation #verification
Simulation knowledge extraction and reuse in constrained random processor verification (WC, LCW, JB, MSA), p. 6.
DATE-2011-DrmanacSWWA #multi #optimisation #parametricity #predict #testing
Multidimensional parametric test set optimization of wafer probe data for predicting in field failures and setting tighter test limits (DGD, NS, LW, LCW, MSA), pp. 794–799.
DAC-2010-CallegariDWA #classification #learning #using
Classification rule learning using subgroup discovery of cross-domain attributes responsible for design-silicon mismatch (NC, DGD, LCW, MSA), pp. 374–379.
DAC-2009-CallegariWB #analysis #ranking
Speedpath analysis based on hypothesis pruning and ranking (NC, LCW, PB), pp. 346–351.
DAC-2009-DrmanacLW #predict #process #variability
Predicting variability in nanoscale lithography processes (DGD, FL, LCW), pp. 545–550.
DAC-2008-BastaniCWA #statistics
Statistical diagnosis of unmodeled systematic timing effects (PB, NC, LCW, MSA), pp. 355–360.
DAC-2008-BastaniKWC #learning #predict #set
Speedpath prediction based on learning from a small set of examples (PB, KK, LCW, EC), pp. 217–222.
DAC-2008-GuzeyWLF #analysis #functional #testing
Functional test selection based on unsupervised support vector analysis (OG, LCW, JRL, HF), pp. 262–267.
DAC-2007-WangBA #correlation #data mining #mining #perspective
Design-Silicon Timing Correlation A Data Mining Perspective (LCW, PB, MSA), pp. 384–389.
DAC-2006-LeeWA #analysis #statistics
Refined statistical static timing analysis through (BNL, LCW, MSA), pp. 149–154.
DATE-2005-LuIPWCC #performance #satisfiability
An Efficient Sequential SAT Solver With Improved Search Strategies (FL, MKI, GP, LCW, KTC, KCC), pp. 1102–1107.
DAC-2004-ParthasarathyICW #constraints #performance #theorem proving
An efficient finite-domain constraint solver for circuits (GP, MKI, KTC, LCW), pp. 212–217.
DAC-2004-WangMCA #learning #on the
On path-based learning and its applications in delay test and diagnosis (LCW, TMM, KTC, MSA), pp. 492–497.
DATE-v1-2004-FengWCL #clustering #simulation
Improved Symoblic Simulation by Dynamic Funtional Space Partitioning (TF, LCW, KTC, CCL), pp. 42–49.
DATE-v1-2004-OngHCW #multi #random
Random Jitter Extraction Technique in a Multi-Gigahertz Signal (CKO, DH, KTC, LCW), pp. 286–291.
DATE-v1-2004-Wang #learning #simulation #validation
Regression Simulation: Applying Path-Based Learning In Delay Test and Post-Silicon Validation (LCW), pp. 692–695.
DATE-v2-2004-MangoCWC #fault #testing
Pattern Selection for Testing of Deep Sub-Micron Timing Defects (MCTC, LCW, KTC), p. 160.
DAC-2003-KrsticWCLM #fault #modelling #statistics
Enhancing diagnosis resolution for delay defects based upon statistical timing and statistical fault models (AK, LCW, KTC, JJL, TMM), pp. 668–673.
DAC-2003-LuWCMH #case study #correlation #industrial
A signal correlation guided ATPG solver and its applications for solving difficult industrial cases (FL, LCW, KTC, JM, ZH), pp. 436–441.
DATE-2003-KrsticWCLA #fault #modelling #statistics
Delay Defect Diagnosis Based Upon Statistical Timing Models — The First Step (AK, LCW, KTC, JJL, MSA), pp. 10328–10335.
DATE-2003-LuWCH #correlation #learning #satisfiability
A Circuit SAT Solver With Signal Correlation Guided Learning (FL, LCW, KTC, RCYH), pp. 10892–10897.
DAC-2002-LiouKWC #analysis #performance #statistics #testing #validation
False-path-aware statistical timing analysis and efficient path selection for delay testing and timing validation (JJL, AK, LCW, KTC), pp. 566–569.
DAC-2002-LiouWCDMKW #fault #multi #performance #testing #using
Enhancing test efficiency for delay fault testing using multiple-clocked schemes (JJL, LCW, KTC, JD, MRM, RK, TWW), pp. 371–374.
DAC-1998-WangAK #array #automation #evaluation #generative #using #verification
Automatic Generation of Assertions for Formal Verification of PowerPC Microprocessor Arrays Using Symbolic Trajectory Evaluation (LCW, MSA, NK), pp. 534–537.
DATE-1998-WangAZ #array #design #effectiveness #validation
Measuring the Effectiveness of Various Design Validation Approaches For PowerPC(TM) Microprocessor Arrays (LCW, MSA, JZ), pp. 273–277.

Bibliography of Software Language Engineering in Generated Hypertext (BibSLEIGH) is created and maintained by Dr. Vadim Zaytsev.
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