Wei Li, Chaowen Yu, Sudhakar M. Reddy, Irith Pomeranz
A scan BIST generation method using a markov source and partial bit-fixing
DAC, 2003.
@inproceedings{DAC-2003-LiYRP,
author = "Wei Li and Chaowen Yu and Sudhakar M. Reddy and Irith Pomeranz",
booktitle = "{Proceedings of the 40th Design Automation Conference}",
doi = "10.1145/775832.775974",
isbn = "1-58113-688-9",
pages = "554--559",
publisher = "{ACM}",
title = "{A scan BIST generation method using a markov source and partial bit-fixing}",
year = 2003,
}