Seiji Kajihara, Masayasu Fukunaga, Xiaoqing Wen, Toshiyuki Maeda, Shuji Hamada, Yasuo Sato
Path delay test compaction with process variation tolerance
DAC, 2005.
@inproceedings{DAC-2005-KajiharaFWMHS,
author = "Seiji Kajihara and Masayasu Fukunaga and Xiaoqing Wen and Toshiyuki Maeda and Shuji Hamada and Yasuo Sato",
booktitle = "{Proceedings of the 42nd Design Automation Conference}",
doi = "10.1145/1065579.1065802",
isbn = "1-59593-058-2",
pages = "845--850",
publisher = "{ACM}",
title = "{Path delay test compaction with process variation tolerance}",
year = 2005,
}