Travelled to:
1 × USA
Collaborated with:
S.Kajihara M.Fukunaga X.Wen T.Maeda Y.Sato
Talks about:
process (1) compact (1) variat (1) toler (1) delay (1) test (1) path (1)
Person: Shuji Hamada
DBLP: Hamada:Shuji
Contributed to:
Wrote 1 papers:
- DAC-2005-KajiharaFWMHS #process
- Path delay test compaction with process variation tolerance (SK, MF, XW, TM, SH, YS), pp. 845–850.