Travelled to:
1 × USA
Collaborated with:
S.Kajihara X.Wen T.Maeda S.Hamada Y.Sato
Talks about:
process (1) compact (1) variat (1) toler (1) delay (1) test (1) path (1)
Person: Masayasu Fukunaga
DBLP: Fukunaga:Masayasu
Contributed to:
Wrote 1 papers:
- DAC-2005-KajiharaFWMHS #process
- Path delay test compaction with process variation tolerance (SK, MF, XW, TM, SH, YS), pp. 845–850.