Kanak Agarwal, Sani R. Nassif
Characterizing Process Variation in Nanometer CMOS
DAC, 2007.
@inproceedings{DAC-2007-AgarwalN, author = "Kanak Agarwal and Sani R. Nassif", booktitle = "{Proceedings of the 44th Design Automation Conference}", doi = "10.1145/1278480.1278582", pages = "396--399", publisher = "{IEEE}", title = "{Characterizing Process Variation in Nanometer CMOS}", year = 2007, }