Kanak Agarwal, Sani R. Nassif
Characterizing Process Variation in Nanometer CMOS
DAC, 2007.
@inproceedings{DAC-2007-AgarwalN,
author = "Kanak Agarwal and Sani R. Nassif",
booktitle = "{Proceedings of the 44th Design Automation Conference}",
doi = "10.1145/1278480.1278582",
pages = "396--399",
publisher = "{IEEE}",
title = "{Characterizing Process Variation in Nanometer CMOS}",
year = 2007,
}











