Kunhyuk Kang, Keejong Kim, Ahmad E. Islam, Muhammad Ashraful Alam, Kaushik Roy
Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement
DAC, 2007.
@inproceedings{DAC-2007-KangKIAR,
author = "Kunhyuk Kang and Keejong Kim and Ahmad E. Islam and Muhammad Ashraful Alam and Kaushik Roy",
booktitle = "{Proceedings of the 44th Design Automation Conference}",
doi = "10.1145/1278480.1278572",
pages = "358--363",
publisher = "{IEEE}",
title = "{Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement}",
year = 2007,
}