Travelled to:1 × USA
Collaborated with:K.Kang K.Kim M.A.Alam K.Roy
Talks about:character (1) reliabl (1) circuit (1) measur (1) degrad (1) under (1) estim (1) nbti (1) line (1) iddq (1)
Person: Ahmad E. Islam
DBLP: Islam:Ahmad_E=
Contributed to:
2007Wrote 1 papers:
- DAC-2007-KangKIAR #estimation #metric #online #reliability #using
- Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement (KK, KK, AEI, MAA, KR), pp. 358–363.