Tao Li, Wenjun Zhang, Zhiping Yu
Full-chip leakage analysis in nano-scale technologies: mechanisms, variation sources, and verification
DAC, 2008.
@inproceedings{DAC-2008-LiZY,
author = "Tao Li and Wenjun Zhang and Zhiping Yu",
booktitle = "{Proceedings of the 45th Design Automation Conference}",
doi = "10.1145/1391469.1391622",
isbn = "978-1-60558-115-6",
pages = "594--599",
publisher = "{ACM}",
title = "{Full-chip leakage analysis in nano-scale technologies: mechanisms, variation sources, and verification}",
year = 2008,
}











