Tao Li, Wenjun Zhang, Zhiping Yu
Full-chip leakage analysis in nano-scale technologies: mechanisms, variation sources, and verification
DAC, 2008.
@inproceedings{DAC-2008-LiZY, author = "Tao Li and Wenjun Zhang and Zhiping Yu", booktitle = "{Proceedings of the 45th Design Automation Conference}", doi = "10.1145/1391469.1391622", isbn = "978-1-60558-115-6", pages = "594--599", publisher = "{ACM}", title = "{Full-chip leakage analysis in nano-scale technologies: mechanisms, variation sources, and verification}", year = 2008, }