Wangyang Zhang, Xin Li, Rob A. Rutenbar
Bayesian virtual probe: minimizing variation characterization cost for nanoscale IC technologies via Bayesian inference
DAC, 2010.
@inproceedings{DAC-2010-ZhangLR, author = "Wangyang Zhang and Xin Li and Rob A. Rutenbar", booktitle = "{Proceedings of the 47th Design Automation Conference}", doi = "10.1145/1837274.1837342", isbn = "978-1-4503-0002-5", pages = "262--267", publisher = "{ACM}", title = "{Bayesian virtual probe: minimizing variation characterization cost for nanoscale IC technologies via Bayesian inference}", year = 2010, }