Fast Sequential Circuit Test Generation Using High-Level and Gate-Level Techniques
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Elizabeth M. Rudnick, Roberto Vietti, Akilah Ellis, Fulvio Corno, Paolo Prinetto, Matteo Sonza Reorda
Fast Sequential Circuit Test Generation Using High-Level and Gate-Level Techniques
DATE, 1998.

DATE 1998
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@inproceedings{DATE-1998-RudnickVECPR,
	author        = "Elizabeth M. Rudnick and Roberto Vietti and Akilah Ellis and Fulvio Corno and Paolo Prinetto and Matteo Sonza Reorda",
	booktitle     = "{Proceedings of the Third Conference on Design, Automation and Test in Europe}",
	doi           = "10.1109/DATE.1998.655915",
	pages         = "570--576",
	publisher     = "{IEEE Computer Society}",
	title         = "{Fast Sequential Circuit Test Generation Using High-Level and Gate-Level Techniques}",
	year          = 1998,
}

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