Travelled to:
1 × France
Collaborated with:
E.M.Rudnick R.Vietti F.Corno P.Prinetto M.S.Reorda
Talks about:
level (2) techniqu (1) sequenti (1) generat (1) circuit (1) test (1) high (1) gate (1) fast (1) use (1)
Person: Akilah Ellis
DBLP: Ellis:Akilah
Contributed to:
Wrote 1 papers:
- DATE-1998-RudnickVECPR #generative #performance #testing #using
- Fast Sequential Circuit Test Generation Using High-Level and Gate-Level Techniques (EMR, RV, AE, FC, PP, MSR), pp. 570–576.