José T. de Sousa, Vishwani D. Agrawal
Reducing the Complexity of Defect Level Modeling Using the Clustering Effect
DATE, 2000.
@inproceedings{DATE-2000-SousaA,
author = "José T. de Sousa and Vishwani D. Agrawal",
booktitle = "{Proceedings of the Fifth Conference on Design, Automation and Test in Europe}",
doi = "10.1109/DATE.2000.840853",
isbn = "0-7695-0537-6",
pages = "640--644",
publisher = "{IEEE Computer Society}",
title = "{Reducing the Complexity of Defect Level Modeling Using the Clustering Effect}",
year = 2000,
}