Michael Pronath, Helmut E. Graeb, Kurt Antreich
A Test Design Method for Floating Gate Defects (FGD) in Analog Integrated Circuits
DATE, 2002.
@inproceedings{DATE-2002-PronathGA,
acmid = "874365",
author = "Michael Pronath and Helmut E. Graeb and Kurt Antreich",
booktitle = "{Proceedings of the Seventh Conference on Design, Automation and Test in Europe}",
doi = "10.1109/DATE.2002.998252",
isbn = "0-7695-1471-5",
pages = "78--83",
publisher = "{IEEE Computer Society}",
title = "{A Test Design Method for Floating Gate Defects (FGD) in Analog Integrated Circuits}",
year = 2002,
}











