Vikram Iyengar, Anshuman Chandra, Sharon Schweizer, Krishnendu Chakrabarty
A Unified Approach for SOC Testing Using Test Data Compression and TAM Optimization
DATE, 2003.
@inproceedings{DATE-2003-IyengarCSC,
acmid = "1022913",
author = "Vikram Iyengar and Anshuman Chandra and Sharon Schweizer and Krishnendu Chakrabarty",
booktitle = "{Proceedings of the Eighth Conference on Design, Automation and Test in Europe}",
doi = "10.1109/DATE.2003.10043",
isbn = "0-7695-1870-2",
pages = "11188--11190",
publisher = "{IEEE Computer Society}",
title = "{A Unified Approach for SOC Testing Using Test Data Compression and TAM Optimization}",
year = 2003,
}