A Unified Approach for SOC Testing Using Test Data Compression and TAM Optimization
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Vikram Iyengar, Anshuman Chandra, Sharon Schweizer, Krishnendu Chakrabarty
A Unified Approach for SOC Testing Using Test Data Compression and TAM Optimization
DATE, 2003.

DATE 2003
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@inproceedings{DATE-2003-IyengarCSC,
	acmid         = "1022913",
	author        = "Vikram Iyengar and Anshuman Chandra and Sharon Schweizer and Krishnendu Chakrabarty",
	booktitle     = "{Proceedings of the Eighth Conference on Design, Automation and Test in Europe}",
	doi           = "10.1109/DATE.2003.10043",
	isbn          = "0-7695-1870-2",
	pages         = "11188--11190",
	publisher     = "{IEEE Computer Society}",
	title         = "{A Unified Approach for SOC Testing Using Test Data Compression and TAM Optimization}",
	year          = 2003,
}

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