Saraju P. Mohanty, Ramakrishna Velagapudi, Elias Kougianos
Physical-aware simulated annealing optimization of gate leakage in nanoscale datapath circuits
DATE, 2006.
@inproceedings{DATE-2006-MohantyVK,
author = "Saraju P. Mohanty and Ramakrishna Velagapudi and Elias Kougianos",
booktitle = "{Proceedings of the 10th Conference on Design, Automation and Test in Europe}",
doi = "10.1145/1131810",
pages = "1191--1196",
publisher = "{European Design and Automation Association, Leuven, Belgium}",
title = "{Physical-aware simulated annealing optimization of gate leakage in nanoscale datapath circuits}",
year = 2006,
}