@inproceedings{DATE-2006-NelsonZDBPMB,
	author        = "Jeffrey E. Nelson and Thomas Zanon and Rao Desineni and Jason G. Brown and N. Patil and Wojciech Maly and R. D. (Shawn) Blanton",
	booktitle     = "{Proceedings of the 10th Conference on Design, Automation and Test in Europe}",
	doi           = "10.1145/1131737",
	pages         = "913--918",
	publisher     = "{European Design and Automation Association, Leuven, Belgium}",
	title         = "{Extraction of defect density and size distributions from wafer sort test results}",
	year          = 2006,
}