Irith Pomeranz, Sudhakar M. Reddy
Test compaction for transition faults under transparent-scan
DATE, 2006.
@inproceedings{DATE-2006-PomeranzR06a,
author = "Irith Pomeranz and Sudhakar M. Reddy",
booktitle = "{Proceedings of the 10th Conference on Design, Automation and Test in Europe}",
doi = "10.1145/1131831",
pages = "1264--1269",
publisher = "{European Design and Automation Association, Leuven, Belgium}",
title = "{Test compaction for transition faults under transparent-scan}",
year = 2006,
}