Myeong-Eun Hwang, Tamer Cakici, Kaushik Roy
Interactive presentation: Process tolerant beta-ratio modulation for ultra-dynamic voltage scaling
DATE, 2007.
@inproceedings{DATE-2007-HwangCR,
author = "Myeong-Eun Hwang and Tamer Cakici and Kaushik Roy",
booktitle = "{Proceedings of the 11th Conference on Design, Automation and Test in Europe}",
doi = "10.1145/1266366.1266705",
isbn = "978-3-9810801-2-4",
pages = "1550--1555",
publisher = "{ACM}",
title = "{Interactive presentation: Process tolerant beta-ratio modulation for ultra-dynamic voltage scaling}",
year = 2007,
}