Travelled to:
1 × France
Collaborated with:
T.Cakici K.Roy
Talks about:
interact (1) process (1) present (1) voltag (1) ultra (1) toler (1) scale (1) ratio (1) modul (1) dynam (1)
Person: Myeong-Eun Hwang
DBLP: Hwang:Myeong=Eun
Contributed to:
Wrote 1 papers:
- DATE-2007-HwangCR #interactive #process #scalability
- Interactive presentation: Process tolerant beta-ratio modulation for ultra-dynamic voltage scaling (MEH, TC, KR), pp. 1550–1555.