Fault Clustering in deep-submicron CMOS Processes
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Jan Schat
Fault Clustering in deep-submicron CMOS Processes
DATE, 2008.

DATE 2008
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@inproceedings{DATE-2008-Schat,
	author        = "Jan Schat",
	booktitle     = "{Proceedings of the 12th Conference on Design, Automation and Test in Europe}",
	doi           = "10.1109/DATE.2008.4484900",
	isbn          = "978-3-9810801-3-1",
	pages         = "511--514",
	publisher     = "{IEEE}",
	title         = "{Fault Clustering in deep-submicron CMOS Processes}",
	year          = 2008,
}

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