Jan Schat
Fault Clustering in deep-submicron CMOS Processes
DATE, 2008.
@inproceedings{DATE-2008-Schat, author = "Jan Schat", booktitle = "{Proceedings of the 12th Conference on Design, Automation and Test in Europe}", doi = "10.1109/DATE.2008.4484900", isbn = "978-3-9810801-3-1", pages = "511--514", publisher = "{IEEE}", title = "{Fault Clustering in deep-submicron CMOS Processes}", year = 2008, }