Impact of voltage scaling on nanoscale SRAM reliability
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Vikas Chandra, Robert C. Aitken
Impact of voltage scaling on nanoscale SRAM reliability
DATE, 2009.

DATE 2009
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@inproceedings{DATE-2009-ChandraA,
	author        = "Vikas Chandra and Robert C. Aitken",
	booktitle     = "{Proceedings of the 13th Conference on Design, Automation and Test in Europe}",
	pages         = "387--392",
	publisher     = "{IEEE}",
	title         = "{Impact of voltage scaling on nanoscale SRAM reliability}",
	year          = 2009,
}

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