A physical-location-aware X-filling method for IR-drop reduction in at-speed scan test
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Wen-Wen Hsieh, I-Sheng Lin, TingTing Hwang
A physical-location-aware X-filling method for IR-drop reduction in at-speed scan test
DATE, 2009.

DATE 2009
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@inproceedings{DATE-2009-HsiehLH,
	author        = "Wen-Wen Hsieh and I-Sheng Lin and TingTing Hwang",
	booktitle     = "{Proceedings of the 13th Conference on Design, Automation and Test in Europe}",
	pages         = "1234--1237",
	publisher     = "{IEEE}",
	title         = "{A physical-location-aware X-filling method for IR-drop reduction in at-speed scan test}",
	year          = 2009,
}

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