Wen-Wen Hsieh, I-Sheng Lin, TingTing Hwang
A physical-location-aware X-filling method for IR-drop reduction in at-speed scan test
DATE, 2009.
@inproceedings{DATE-2009-HsiehLH,
author = "Wen-Wen Hsieh and I-Sheng Lin and TingTing Hwang",
booktitle = "{Proceedings of the 13th Conference on Design, Automation and Test in Europe}",
pages = "1234--1237",
publisher = "{IEEE}",
title = "{A physical-location-aware X-filling method for IR-drop reduction in at-speed scan test}",
year = 2009,
}











