Travelled to:1 × France
Collaborated with:I.Lin T.Hwang
Talks about:reduct (1) physic (1) method (1) speed (1) locat (1) test (1) scan (1) fill (1) drop (1) awar (1)
Person: Wen-Wen Hsieh
DBLP: Hsieh:Wen=Wen
Contributed to:
2009Wrote 1 papers:
- DATE-2009-HsiehLH #reduction
- A physical-location-aware X-filling method for IR-drop reduction in at-speed scan test (WWH, ISL, TH), pp. 1234–1237.