Test cost reduction for multiple-voltage designs with bridge defects through Gate-Sizing
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S. Saqib Khursheed, Bashir M. Al-Hashimi, Peter Harrod
Test cost reduction for multiple-voltage designs with bridge defects through Gate-Sizing
DATE, 2009.

DATE 2009
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@inproceedings{DATE-2009-KhursheedAH,
	author        = "S. Saqib Khursheed and Bashir M. Al-Hashimi and Peter Harrod",
	booktitle     = "{Proceedings of the 13th Conference on Design, Automation and Test in Europe}",
	pages         = "1349--1354",
	publisher     = "{IEEE}",
	title         = "{Test cost reduction for multiple-voltage designs with bridge defects through Gate-Sizing}",
	year          = 2009,
}

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