Travelled to:
1 × France
Collaborated with:
S.S.Khursheed B.M.Al-Hashimi
Talks about:
multipl (1) voltag (1) reduct (1) design (1) defect (1) bridg (1) test (1) size (1) gate (1) cost (1)
Person: Peter Harrod
DBLP: Harrod:Peter
Contributed to:
Wrote 1 papers:
- DATE-2009-KhursheedAH #design #fault #multi #reduction
- Test cost reduction for multiple-voltage designs with bridge defects through Gate-Sizing (SSK, BMAH, PH), pp. 1349–1354.