Efficient and accurate method for intra-gate defect diagnoses in nanometer technology and volume data
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Aymen Ladhar, Mohamed Masmoudi, Laroussi Bouzaida
Efficient and accurate method for intra-gate defect diagnoses in nanometer technology and volume data
DATE, 2009.

DATE 2009
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@inproceedings{DATE-2009-LadharMB,
	author        = "Aymen Ladhar and Mohamed Masmoudi and Laroussi Bouzaida",
	booktitle     = "{Proceedings of the 13th Conference on Design, Automation and Test in Europe}",
	pages         = "988--993",
	publisher     = "{IEEE}",
	title         = "{Efficient and accurate method for intra-gate defect diagnoses in nanometer technology and volume data}",
	year          = 2009,
}

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