Travelled to:
1 × France
Collaborated with:
M.Masmoudi L.Bouzaida
Talks about:
technolog (1) nanomet (1) diagnos (1) method (1) effici (1) defect (1) volum (1) intra (1) accur (1) gate (1)
Person: Aymen Ladhar
DBLP: Ladhar:Aymen
Contributed to:
Wrote 1 papers:
- DATE-2009-LadharMB #fault #performance
- Efficient and accurate method for intra-gate defect diagnoses in nanometer technology and volume data (AL, MM, LB), pp. 988–993.