S. Balatsouka, Vasileios Tenentes, Xrysovalantis Kavousianos, Krishnendu Chakrabarty
Defect aware X-filling for low-power scan testing
DATE, 2010.
@inproceedings{DATE-2010-BalatsoukaTKC,
author = "S. Balatsouka and Vasileios Tenentes and Xrysovalantis Kavousianos and Krishnendu Chakrabarty",
booktitle = "{Proceedings of the 14th Conference on Design, Automation and Test in Europe}",
pages = "873--878",
publisher = "{IEEE}",
title = "{Defect aware X-filling for low-power scan testing}",
year = 2010,
}