Defect aware X-filling for low-power scan testing
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S. Balatsouka, Vasileios Tenentes, Xrysovalantis Kavousianos, Krishnendu Chakrabarty
Defect aware X-filling for low-power scan testing
DATE, 2010.

DATE 2010
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@inproceedings{DATE-2010-BalatsoukaTKC,
	author        = "S. Balatsouka and Vasileios Tenentes and Xrysovalantis Kavousianos and Krishnendu Chakrabarty",
	booktitle     = "{Proceedings of the 14th Conference on Design, Automation and Test in Europe}",
	pages         = "873--878",
	publisher     = "{IEEE}",
	title         = "{Defect aware X-filling for low-power scan testing}",
	year          = 2010,
}

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