Travelled to:
1 × Germany
Collaborated with:
V.Tenentes X.Kavousianos K.Chakrabarty
Talks about:
defect (1) power (1) test (1) scan (1) fill (1) awar (1) low (1)
Person: S. Balatsouka
DBLP: Balatsouka:S=
Contributed to:
Wrote 1 papers:
- DATE-2010-BalatsoukaTKC #fault #power management #testing
- Defect aware X-filling for low-power scan testing (SB, VT, XK, KC), pp. 873–878.