Wei Zhang, Jiale Huang, Shengqi Yang, Pallav Gupta
Case study: Alleviating hotspots and improving chip reliability via carbon nanotube thermal interface
DATE, 2011.
@inproceedings{DATE-2011-ZhangHYG,
author = "Wei Zhang and Jiale Huang and Shengqi Yang and Pallav Gupta",
booktitle = "{Proceedings of the 15th Conference on Design, Automation and Test in Europe}",
isbn = "978-1-61284-208-0",
pages = "1071--1076",
publisher = "{IEEE}",
title = "{Case study: Alleviating hotspots and improving chip reliability via carbon nanotube thermal interface}",
year = 2011,
}