BibSLEIGH — On-chip source synchronous interface timing test scheme with calibration

Hyunjin Kim, Jacob A. Abraham
On-chip source synchronous interface timing test scheme with calibration
DATE, 2012.

DATE 2012

@inproceedings{DATE-2012-KimA,
	acmid         = "2492991",
	author        = "Hyunjin Kim and Jacob A. Abraham",
	booktitle     = "{Proceedings of the 16th Conference and Exhibition on Design, Automation and Test in Europe}",
	isbn          = "978-1-4577-2145-8",
	pages         = "1146--1149",
	publisher     = "{IEEE}",
	title         = "{On-chip source synchronous interface timing test scheme with calibration}",
	year          = 2012,
}

Hyunjin Kim, Jacob A. AbrahamOn-chip source synchronous interface timing test scheme with calibrationDATE, 2012.

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Hyunjin Kim, Jacob A. Abraham
On-chip source synchronous interface timing test scheme with calibration
DATE, 2012.