Travelled to:
2 × Germany
Collaborated with:
J.A.Abraham J.Shin S.Kang
Talks about:
test (2) interconnect (1) synchron (1) interfac (1) boundari (1) multipl (1) system (1) scheme (1) calibr (1) speed (1)
Person: Hyunjin Kim
DBLP: Kim:Hyunjin
Contributed to:
Wrote 2 papers:
- DATE-2012-KimA #interface
- On-chip source synchronous interface timing test scheme with calibration (HK, JAA), pp. 1146–1149.
- DATE-1999-ShinKK #bound #multi #testing
- At-Speed Boundary-Scan Interconnect Testing in a Board with Multiple System Clocks (JS, HK, SK), p. 473–?.