Min Li, Azadeh Davoodi, Lin Xie
Custom on-chip sensors for post-silicon failing path isolation in the presence of process variations
DATE, 2012.
@inproceedings{DATE-2012-LiDX,
acmid = "2493095",
author = "Min Li and Azadeh Davoodi and Lin Xie",
booktitle = "{Proceedings of the 16th Conference and Exhibition on Design, Automation and Test in Europe}",
isbn = "978-1-4577-2145-8",
pages = "1591--1596",
publisher = "{IEEE}",
title = "{Custom on-chip sensors for post-silicon failing path isolation in the presence of process variations}",
year = 2012,
}