1 × Germany
1 × USA
A.Davoodi M.Li K.K.Saluja
silicon (3) post (3) variat (2) path (2) fail (2) manufactur (1) speedpath (1) diagnosi (1) variabl (1) segment (1)
Person: Lin Xie
Wrote 3 papers:
- DATE-2012-LiDX #process
- Custom on-chip sensors for post-silicon failing path isolation in the presence of process variations (ML, AD, LX), pp. 1591–1596.
- DAC-2010-XieD #predict #variability
- Representative path selection for post-silicon timing prediction under variability (LX, AD), pp. 386–391.
- Post-silicon diagnosis of segments of failing speedpaths due to manufacturing variations (LX, AD, KKS), pp. 274–279.