Yaojun Zhang, Xiaobin Wang, Yong Li, Alex K. Jones, Yiran Chen
Asymmetry of MTJ switching and its implication to STT-RAM designs
DATE, 2012.
@inproceedings{DATE-2012-ZhangWLJC,
acmid = "2493031",
author = "Yaojun Zhang and Xiaobin Wang and Yong Li and Alex K. Jones and Yiran Chen",
booktitle = "{Proceedings of the 16th Conference and Exhibition on Design, Automation and Test in Europe}",
isbn = "978-1-4577-2145-8",
pages = "1313--1318",
publisher = "{IEEE}",
title = "{Asymmetry of MTJ switching and its implication to STT-RAM designs}",
year = 2012,
}
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