Francesco Beneventi, Andrea Bartolini, Pascal Vivet, Denis Dutoit, Luca Benini
Thermal analysis and model identification techniques for a logic + WIDEIO stacked DRAM test chip
DATE, 2014.
@inproceedings{DATE-2014-BeneventiBVDB,
author = "Francesco Beneventi and Andrea Bartolini and Pascal Vivet and Denis Dutoit and Luca Benini",
booktitle = "{Proceedings of the 18th Conference and Exhibition on Design, Automation and Test in Europe}",
doi = "10.7873/DATE.2014.345",
pages = "1--4",
publisher = "{IEEE}",
title = "{Thermal analysis and model identification techniques for a logic + WIDEIO stacked DRAM test chip}",
year = 2014,
}