Thermal analysis and model identification techniques for a logic + WIDEIO stacked DRAM test chip
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Francesco Beneventi, Andrea Bartolini, Pascal Vivet, Denis Dutoit, Luca Benini
Thermal analysis and model identification techniques for a logic + WIDEIO stacked DRAM test chip
DATE, 2014.

DATE 2014
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@inproceedings{DATE-2014-BeneventiBVDB,
	author        = "Francesco Beneventi and Andrea Bartolini and Pascal Vivet and Denis Dutoit and Luca Benini",
	booktitle     = "{Proceedings of the 18th Conference and Exhibition on Design, Automation and Test in Europe}",
	doi           = "10.7873/DATE.2014.345",
	pages         = "1--4",
	publisher     = "{IEEE}",
	title         = "{Thermal analysis and model identification techniques for a logic + WIDEIO stacked DRAM test chip}",
	year          = 2014,
}

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