BibSLEIGH — A 0.18 µm CMOS Implementation of On-chip Analogue Test Signal Generation from Digital Test Patterns

Luís Rolíndez, Salvador Mir, Guillaume Prenat, Ahcène Bounceur
A 0.18 µm CMOS Implementation of On-chip Analogue Test Signal Generation from Digital Test Patterns
DATE, 2004.

DATE v1 2004

@inproceedings{DATE-v1-2004-RolindezMPB,
	author        = "Luís Rolíndez and Salvador Mir and Guillaume Prenat and Ahcène Bounceur",
	booktitle     = "{Proceedings of the Eighth Conference on Design, Automation and Test in Europe, Volume 1}",
	doi           = "10.1109/DATE.2004.1268939",
	isbn          = "0-7695-2085-5",
	pages         = "706--707",
	publisher     = "{IEEE Computer Society}",
	title         = "{A 0.18 µm CMOS Implementation of On-chip Analogue Test Signal Generation from Digital Test Patterns}",
	year          = 2004,
}

Luís Rolíndez, Salvador Mir, Guillaume Prenat, Ahcène BounceurA 0.18 µm CMOS Implementation of On-chip Analogue Test Signal Generation from Digital Test PatternsDATE, 2004.

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Luís Rolíndez, Salvador Mir, Guillaume Prenat, Ahcène Bounceur
A 0.18 µm CMOS Implementation of On-chip Analogue Test Signal Generation from Digital Test Patterns
DATE, 2004.