BibSLEIGH — Hybrid Delay Scan: A Low Hardware Overhead Scan-Based Delay Test Technique for High Fault Coverage and Compact Test Sets

Seongmoon Wang, Xiao Liu, Srimat T. Chakradhar
Hybrid Delay Scan: A Low Hardware Overhead Scan-Based Delay Test Technique for High Fault Coverage and Compact Test Sets
DATE, 2004.

DATE v2 2004

@inproceedings{DATE-v2-2004-WangLC,
	author        = "Seongmoon Wang and Xiao Liu and Srimat T. Chakradhar",
	booktitle     = "{Proceedings of the Eighth Conference on Design, Automation and Test in Europe, Volume 2}",
	doi           = "10.1109/DATE.2004.1269074",
	isbn          = "0-7695-2085-5",
	pages         = "1296--1301",
	publisher     = "{IEEE Computer Society}",
	title         = "{Hybrid Delay Scan: A Low Hardware Overhead Scan-Based Delay Test Technique for High Fault Coverage and Compact Test Sets}",
	year          = 2004,
}

Seongmoon Wang, Xiao Liu, Srimat T. ChakradharHybrid Delay Scan: A Low Hardware Overhead Scan-Based Delay Test Technique for High Fault Coverage and Compact Test SetsDATE, 2004.

Tags:

Seongmoon Wang, Xiao Liu, Srimat T. Chakradhar
Hybrid Delay Scan: A Low Hardware Overhead Scan-Based Delay Test Technique for High Fault Coverage and Compact Test Sets
DATE, 2004.