Taek Lee, Jaechang Nam, DongGyun Han, Sunghun Kim, Hoh Peter In
Micro interaction metrics for defect prediction
ESEC-FSE, 2011.
@inproceedings{ESEC-FSE-2011-LeeNHKI,
author = "Taek Lee and Jaechang Nam and DongGyun Han and Sunghun Kim and Hoh Peter In",
booktitle = "{Proceedings of the 19th Symposium on the Foundations of Software Engineering and the 13rd European Software Engineering Conference}",
doi = "10.1145/2025113.2025156",
editor = "Tibor Gyimóthy and Andreas Zeller",
isbn = "978-1-4503-0443-6",
pages = "311--321",
publisher = "{ACM}",
title = "{Micro interaction metrics for defect prediction}",
year = 2011,
}
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