Travelled to:
1 × Hungary
Collaborated with:
J.Nam D.Han S.Kim H.P.In
Talks about:
interact (1) predict (1) metric (1) defect (1) micro (1)
Person: Taek Lee
DBLP: Lee:Taek
Contributed to:
Wrote 1 papers:
- ESEC-FSE-2011-LeeNHKI #fault #interactive #metric #predict
- Micro interaction metrics for defect prediction (TL, JN, DH, SK, HPI), pp. 311–321.