Travelled to:
1 × Germany
Collaborated with:
A.Sreedhar S.Kundu
Talks about:
lithographi (1) circuit (1) relat (1) model (1) fault (1) test (1) open (1) nano (1) cmos (1)
Person: Alodeep Sanyal
DBLP: Sanyal:Alodeep
Contributed to:
Wrote 1 papers:
- DATE-2008-SreedharSK #fault #modelling #on the #testing
- On Modeling and Testing of Lithography Related Open Faults in Nano-CMOS Circuits (AS, AS, SK), pp. 616–621.