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Travelled to:
1 × Germany
2 × France
Collaborated with:
S.Kundu A.Sanyal
Talks about:
test (3) lithographi (2) lithograph (2) process (2) variat (2) design (2) model (2) base (2) manufactur (1) linewidth (1)

Person: Aswin Sreedhar

DBLP DBLP: Sreedhar:Aswin

Contributed to:

DATE 20112011
DATE 20092009
DATE 20082008

Wrote 5 papers:

DATE-2011-KunduS #design #modelling #process
Modeling manufacturing process variation for design and test (SK, AS), pp. 1147–1152.
DATE-2011-SreedharK #design #identification #on the #process
On design of test structures for lithographic process corner identification (AS, SK), pp. 800–805.
DATE-2011-SreedharK11a #security
Physically unclonable functions for embeded security based on lithographic variation (AS, SK), pp. 1632–1637.
DATE-2009-SreedharK #analysis #on the
On linewidth-based yield analysis for nanometer lithography (AS, SK), pp. 381–386.
DATE-2008-SreedharSK #fault #modelling #on the #testing
On Modeling and Testing of Lithography Related Open Faults in Nano-CMOS Circuits (AS, AS, SK), pp. 616–621.

Bibliography of Software Language Engineering in Generated Hypertext (BibSLEIGH) is created and maintained by Dr. Vadim Zaytsev.
Hosted as a part of SLEBOK on GitHub.