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Travelled to:
1 × Canada
Collaborated with:
S.Lin M.Jeng
Talks about:
semiconductor (1) hopfield (1) competit (1) network (1) neural (1) detect (1) defect (1) wafer (1) layer (1) use (1)

Person: Chuan-Yu Chang

DBLP DBLP: Chang:Chuan=Yu

Contributed to:

CASE 20052005

Wrote 1 papers:

CASE-2005-ChangLJ #detection #fault #network #using
Using a two-layer competitive Hopfield neural network for semiconductor wafer defect detection (CYC, SYL, MJ), pp. 301–306.
Bibliography of Software Language Engineering in Generated Hypertext (BibSLEIGH) is created and maintained by Dr. Vadim Zaytsev.
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