Travelled to:1 × Canada
Collaborated with:C.Chang M.Jeng
Talks about:semiconductor (1) hopfield (1) competit (1) network (1) neural (1) detect (1) defect (1) wafer (1) layer (1) use (1)
Person: Si-Yan Lin
DBLP: Lin:Si=Yan
Contributed to:
2005Wrote 1 papers:
- CASE-2005-ChangLJ #detection #fault #network #using
- Using a two-layer competitive Hopfield neural network for semiconductor wafer defect detection (CYC, SYL, MJ), pp. 301–306.