Travelled to:1 × USA
Collaborated with:P.Agrawal V.D.Agrawal
Talks about:generat (1) express (1) circuit (1) boolean (1) fault (1) delay (1) test (1) scan (1) hold (1) use (1)
Person: Debashis Bhattacharya
DBLP: Bhattacharya:Debashis
Contributed to:
1992Wrote 1 papers:
- DAC-1992-BhattacharyaAA #fault #generative #testing #using
- Delay Fault Test Generation for Scan/Hold Circuits Using Boolean Expressions (DB, PA, VDA), pp. 159–164.