Travelled to:1 × India
Collaborated with:J.B.0001 K.Harvey S.Sethumadhavan G.E.Kaiser T.Jebara S.Chang C.Fan Y.Tsai J.Jheng C.Kao C.Lu
Talks about:semiconductor (1) manufactur (1) knowledg (1) approach (1) symptom (1) softwar (1) similar (1) ontolog (1) identif (1) detect (1)
Person: Fang-Hsiang Su
DBLP: Su:Fang=Hsiang
Contributed to:
2009
2016Wrote 2 papers:
- CASE-2009-SuCFTJKL #approach #identification #information management #novel #ontology
- A novel ontology-based knowledge engineering approach for yield symptom identification in semiconductor manufacturing (FHS, SCC, CMF, YJT, JJ, CPK, CYL), pp. 433–438.
- FSE-2016-SuBHSKJ #detection
- Code relatives: detecting similarly behaving software (FHS, JB0, KH, SS, GEK, TJ), pp. 702–714.