Travelled to:
1 × India
Collaborated with:
F.Su S.Chang C.Fan Y.Tsai J.Jheng C.Kao
Talks about:
semiconductor (1) manufactur (1) knowledg (1) approach (1) symptom (1) ontolog (1) identif (1) yield (1) novel (1) engin (1)
Person: Chun-Yao Lu
DBLP: Lu:Chun=Yao
Contributed to:
Wrote 1 papers:
- CASE-2009-SuCFTJKL #approach #identification #information management #novel #ontology
- A novel ontology-based knowledge engineering approach for yield symptom identification in semiconductor manufacturing (FHS, SCC, CMF, YJT, JJ, CPK, CYL), pp. 433–438.