Travelled to:1 × India
Collaborated with:Y.Lu F.Su S.Chang Y.Tsai J.Jheng C.Kao C.Lu
Talks about:yield (2) semiconductor (1) manufactur (1) knowledg (1) diagnosi (1) bayesian (1) approach (1) symptom (1) support (1) ontolog (1)
Person: Chih-Min Fan
DBLP: Fan:Chih=Min
Contributed to:
2009Wrote 2 papers:
- CASE-2009-FanL #effectiveness #ranking
- A Bayesian Ranking Scheme for supporting cost-effective yield diagnosis services (CMF, YPL), pp. 427–432.
- CASE-2009-SuCFTJKL #approach #identification #information management #novel #ontology
- A novel ontology-based knowledge engineering approach for yield symptom identification in semiconductor manufacturing (FHS, SCC, CMF, YJT, JJ, CPK, CYL), pp. 433–438.