Travelled to:
1 × Germany
Collaborated with:
G.Zeng
Talks about:
test (2) concurr (1) disabl (1) share (1) chain (1) scan (1) core (1) use (1) soc (1) set (1)
Person: Hideo Ito
DBLP: Ito:Hideo
Contributed to:
Wrote 1 papers:
- DATE-2006-ZengI #concurrent #testing #using
- Concurrent core test for SOC using shared test set and scan chain disable (GZ, HI), pp. 1045–1050.